Software Library API naibrd 2.24.0
See all documentation at naii.docs.com
Functions
Built-in Test Functions
NAI Board Library - Module Functions » LVDT Module Functions

Functions

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_SetModuleBITEnable (int32_t cardIndex, int32_t module, naibrd_lvdt_test_enable_t type, bool_t bitEnable)
 Enables/Disables the BIT test specified by the type parameter. BITs are described as follows:
 
NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_GetModuleBITEnable (int32_t cardIndex, int32_t module, naibrd_lvdt_test_enable_t type, bool_t *p_outbitEnable)
 Retrieves the state (Enabled or disabled) of the BIT test specified by the type parameter. BITs are described as follows:
 
NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_CheckPowerOnBITComplete (int32_t cardIndex, int32_t module, bool_t *p_outpbitComplete)
 Retrieves the Power-On BIT (PBIT) status (complete or incomplete) for the specified module. The PBIT result will be in the BIT status register.
 
NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_SetTestPosition (int32_t cardIndex, int32_t module, float64_t testPosition)
 Sets the Test Position used for the D0 Test.
 
NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_GetTestPosition (int32_t cardIndex, int32_t module, float64_t *p_outtestPosition)
 Retrieves the Test Position used for the D0 Test.
 
NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_SetD2TestVerifyValue (int32_t cardIndex, int32_t module, uint32_t value)
 Sets the D2 Test Verify value. When the D2 test is enabled, the board will set the D2 Test Verify register to 0x55. An external application can write a value to the D2 Test Verify register and then read it after 30 seconds to verify that the background bit testing (D2 test) is activated.
 
NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_GetD2TestVerifyValue (int32_t cardIndex, int32_t module, uint32_t *p_outvalue)
 Retrieves the D2 Test Verify value. When the D2 test is enabled, the board will set the D2 Test Verify register to 0x55. An external application can write a value to the D2 Test Verify register and then read it after 30 seconds to verify that the background bit testing (D2 test) is activated.
 

Detailed Description

Function Documentation

◆ naibrd_LVDT_CheckPowerOnBITComplete()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_CheckPowerOnBITComplete ( int32_t cardIndex,
int32_t module,
bool_t * p_outpbitComplete )

Retrieves the Power-On BIT (PBIT) status (complete or incomplete) for the specified module. The PBIT result will be in the BIT status register.

Note
This feature is only available on the LD2.
Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
p_outpbitComplete: (Output) NAI_TRUE = PBIT complete, NAI_FALSE = PBIT not complete.
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_NOT_OPEN when handle to board is invalid.
  • NAI_ERROR_NOT_SUPPORTED when the module does not support Power-On BIT.

◆ naibrd_LVDT_GetD2TestVerifyValue()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_GetD2TestVerifyValue ( int32_t cardIndex,
int32_t module,
uint32_t * p_outvalue )

Retrieves the D2 Test Verify value. When the D2 test is enabled, the board will set the D2 Test Verify register to 0x55. An external application can write a value to the D2 Test Verify register and then read it after 30 seconds to verify that the background bit testing (D2 test) is activated.

Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
p_outvalue: (Output) D2 Test Verify value (0x55 if D2 test is activated and running).
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_NOT_SUPPORTED when function is not supported.

◆ naibrd_LVDT_GetModuleBITEnable()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_GetModuleBITEnable ( int32_t cardIndex,
int32_t module,
naibrd_lvdt_test_enable_t type,
bool_t * p_outbitEnable )

Retrieves the state (Enabled or disabled) of the BIT test specified by the type parameter. BITs are described as follows:

UBIT (D0) - An off-line test that is used to check the card and interface. This will disconnect all channels from the I/O and to connect them across an internal stimulus. Test parameters are controlled by the user and are entered in the D0 Test Level and D0 Test Polarity registers. The outputs from the channels are monitored internally for proper conversion. External stimulus is not required.

IBIT (D3) - An off-line test that starts an initiated BIT test that disconnects all channels from the I/O and then connects them across an internal stimulus. Each channel will be checked to a pre-determined test accuracy. Test cycle is completed when D3 changes from 1 to 0. Results can be read from the Status registers. The test can be enabled or disabled at any time.

Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
type: (Input) The BIT type to check.
p_outbitEnable: (Output) BIT Enabled (0 = disabled, 1 = enabled).
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_NOT_OPEN when handle to board is invalid.
  • NAI_ERROR_INVALID_CHANNEL when invalid channel parameter is specified.
  • NAI_ERROR_NOT_SUPPORTED when function is not supported.

◆ naibrd_LVDT_GetTestPosition()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_GetTestPosition ( int32_t cardIndex,
int32_t module,
float64_t * p_outtestPosition )

Retrieves the Test Position used for the D0 Test.

Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
p_outtestPosition: (Output) -100 <= TestPosition <= +100.
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_NOT_SUPPORTED when function is not supported.

◆ naibrd_LVDT_SetD2TestVerifyValue()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_SetD2TestVerifyValue ( int32_t cardIndex,
int32_t module,
uint32_t value )

Sets the D2 Test Verify value. When the D2 test is enabled, the board will set the D2 Test Verify register to 0x55. An external application can write a value to the D2 Test Verify register and then read it after 30 seconds to verify that the background bit testing (D2 test) is activated.

Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
value: (Input) Test Verify Value.
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_NOT_SUPPORTED when function is not supported.

◆ naibrd_LVDT_SetModuleBITEnable()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_SetModuleBITEnable ( int32_t cardIndex,
int32_t module,
naibrd_lvdt_test_enable_t type,
bool_t bitEnable )

Enables/Disables the BIT test specified by the type parameter. BITs are described as follows:

UBIT (D0) - An off-line test that is used to check the card and interface. This will disconnect all channels from the I/O and to connect them across an internal stimulus. Test parameters are controlled by the user and are entered in the D0 Test Level and D0 Test Polarity registers. The outputs from the channels are monitored internally for proper conversion. External stimulus is not required.

IBIT (D3) - An off-line test that starts an initiated BIT test that disconnects all channels from the I/O and then connects them across an internal stimulus. Each channel will be checked to a pre-determined test accuracy. Test cycle is completed when D3 changes from 1 to 0. Results can be read from the Status registers. The test can be enabled or disabled at any time.

Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
type: (Input) The BIT type to enable/disable.
bitEnable: (Input) BIT Enable (0 = disable, 1 = enable).
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_NOT_OPEN when handle to board is invalid.
  • NAI_ERROR_INVALID_CHANNEL when invalid channel parameter is specified.
  • NAI_ERROR_NOT_SUPPORTED when the function is not supported.

◆ naibrd_LVDT_SetTestPosition()

NAIBRDFUNC nai_status_t NAIAPI naibrd_LVDT_SetTestPosition ( int32_t cardIndex,
int32_t module,
float64_t testPosition )

Sets the Test Position used for the D0 Test.

Parameters
cardIndex: (Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module: (Input) Module Number of the module to access (1 - [max modules for board]).
testPosition: (Input) -100 <= TestPosition <= +100.
Returns
  • NAI_SUCCESS
  • NAI_ERROR_INVALID_CARD when invalid card parameter is specified.
  • NAI_ERROR_INVALID_MODULE when invalid module parameter is specified.
  • NAI_ERROR_INVALID_VALUE when invalid testPosition parameter is specified.
  • NAI_ERROR_NOT_SUPPORTED when function is not supported.