Serial Built-In-Test

Functions
void	Run_SER_BIT (int32_t cardIndex, int32_t module, uint32_t moduleID)

Detailed Description

The purpose of the Serial built-in-test sample application is to illustrate the methods to call in the naibrd library to run the built-in-test on the serial module.

To run BIT, ensure the selected channel is disabled, BIT will not run if the channel is enabled. (For SC3 modules, channels need to be disabled in pairs: 1 & 2, 2 & 3, etc., otherwise BIT will timeout.) Start BIT by calling naibrd_SER_InitiateBIT, passing in NAIBRD_SER_INITIATE_BIT_WAIT_RESULT as the last argument to this function will wait until the test is finished and return its value. If you pass in NAIBRD_SER_INITIATE_BIT_NOWAIT_RESULT the program will not wait for the result of the BIT to come back. You can check it at a later time by using naibrd_SER_CheckBitComplete and naibrd_SER_GetBITStatus.

Function Documentation

Run_SER_BIT()

void Run_SER_BIT	(	int32_t	cardIndex,
		int32_t	module,
		uint32_t	moduleID )

Configures a serial module, runs a built-in-test and checks the results.

Parameters

cardIndex	(Input) Logical Card Index assigned to connection with the NAI_BOARD (0 - NAI_MAX_CARDS-1).
module	(Input) Module Number of the module to access (1 - [max modules for board]).
moduleID	(Input) The ID of the module.